Supporting KLA MicroSense wafer geometry measurement system products C200L, C200STR for the whole China region. • Drive customer satisfaction by organizing resource from factory, development and service teams to track and solve outstanding application gaps. Piloted the accomplishment of 7 new feature requests, 30+ application cases and 50+ hardware cases.• Execute application segment of Field Product Acceptance process by working with customer and local team. Closed FPA of 40+ tools.• Provide technical sales support for product penetration and adoption at current and new customers.

Utilized SPC principles, design of experiment, Six Sigma methodologies, OCAP design, FMEA to improve processes, reduce cost and enhance delivery.• Lithography: Owner of Canon stepper and SUSS MA 200. Supported sustaining team on troubleshooting. Improved process control and qualify new processes.• Metrology Process: KLA Archer 200 and CDSEM process owner. • Scrap Reduction Champion. Drove 8D and FMEA projects to improve quality control. Reduced risks of scrap incidents.• SPC Champion. Troubleshot photo SPC violations. Ensured litho SPC database being setup and reported correctly. Secured quality control.