Staff Asic Design Engineer
Current- 2013.3~present- SOC projects(28nm): DFT including scan chain inserting at block level, chain verification, spf test setup procedure generation and pattern generation and verification for both SA and TDF at top level.Test coverage analysis and Test points file generation to improve the test coverage and to reduce pattern number with TMAX tool and manual generation.(test coverage up to 99.5%)- 2009.3~2013.2- Read channal project serial(45nm): DFT including scan chain insertion, atpg pattern generation, convertion and verification.- Fault simulation, estimate the functional test case test coverage through creative circuits around nonscan custom IP(verifault)- - 2008.10~2009.3- Read channal project serial(65nm): Memory Bist. Bist Algorithm selection. Memory group defination. Bist clock plan.- - 2008.2~2008.10- Read channal project serial(65nm): STA, ECO and Timing model extracting.- - 2007.2~2008.2- Read channal project serial(90nm): STA and ECO.