AFM tips

Scanning Probe Microscopy (SPM) and Atomic Force Microscopy (AFM) are non-optical microscopy techniques to investigate the surface topography of materials on the molecular and atomic level among other things. The technique is used in materials science, chemistry, biochemistry, biology and life sciences. Depending on the nature of the materials investigated and the AFM mode employed different types of AFM tip shapes and AFM cantilever properties are necessary to achieve optimal and consistent research results. This page is dedicated to presenting information on and discussing the wide variety of available AFM tips for all kinds of applications manufactured by members of the NanoWorld group. Impressum https://www.nanoandmore.com/impressum