GETec Microscopy offers innovative atomic force microscope (AFM) solutions for seamless integration into existing host systems like scanning electron microscopes (SEM). In partnership with our customers, we develop dedicated nano analysis tools based on pre-engineered modules.
AFSEM™ is an atomic force microscope (AFM) by GETec Microscopy, designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The complimentary image data of AFM and SEM enable unique characterization of your sample.
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Company Details
- Employees
- 1
- Address
- Seestadtstraße 27, Wien,1220,austria
- Industry
- Nanotechnology Research
- NAICS
-
Research and Development in Nanotechnology
- Website
- getec-afm.com
- Keywords
- microscopy, atomic force microscope, scanning electron microscope, correlated microscopy, AFSEM, SEM add-on, nanotechnology, AFM, SEM.
- HQ
- Wien
Getec Microscopy Questions
Getec Microscopy's website is getec-afm.com
Getec Microscopy's LinkedIn profile is https://at.linkedin.com/company/getec-microscopy
Getec Microscopy has
1 employees.
View email and phone details for 1
employees at Getec Microscopy.
Getec Microscopy's industry is
Nanotechnology Research
Getec Microscopy's top competitors are
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Getec Microscopy's categories are Nanotechnology Research
