Helm Scientific Laboratory
Company

Helm Scientific Laboratory

Measuring And Control Instrument Manufacturing Fountain Valley, California, United States 6 employees
Employees
6

Helm Scientific Laboratory Overview

Headquarters
Fountain Valley, California, United States
Industry
Measuring And Control Instrument Manufacturing
Employees
6
Founded
2020
NAICS
Navigational, Measuring, Electromedical, and Control Instruments Manufacturing
Electromedical and Electrotherapeutic Apparatus Manufacturing
Search, Detection, Navigation, Guidance, Aeronautical, and Nautical System and Instrument Manufacturing

About Helm Scientific Laboratory

Helm Scientific (E-mail: Device.lab@helmscientific.com) offers low-cost, high-performance Raman spectrometers for education and R&D. Our products are specifically designed to measure Raman and photoluminescence spectra of silicon wafers, thin films and coatings, dilute aqueous and organic solutions of various solutes, other liquids or solid samples under 532 nm laser excitation. Samples on glass slides can also be tested for chemical, biological and surface-enhanced Raman scattering (SERS) analyses. Main applications include 1) silicon and III-V semiconductors and transition metal chalcogenide 2D materials, 2) chemical, biochemical, and pharmaceutical analysis, and 3) chemical reaction kinetics and mechanisms. We provide the analytical services of emission, absorption, fluorescence and Raman spectroscopy. Helm Scientific specializes in the advanced wafer-level probing of electronic and photonic devices, and provides consulting services to improve semiconductor wafer manufacture that involves photo lithography, ion implant, rapid thermal process, diffusion, dielectric & metal film growth, dry & wet etch, and 3-D wafer-level integration etc. * Electrically and optically characterizing micro/nano semiconductor (Si, Ge, III-V) devices and materials via proven methods based on device physics * Systematically analyzing electrical parameters to debug device physical structures and identify process, integration and design issues * Correlating device parametric data to wafer process parameters and metrology data for statistical process control (SPC) and yield improvement * Failure analysis (FA) to segment the process-related root causes, and propose design, process & integration fixes * Advanced e-test code development for device parametric analyzers, waveform/pulse generators, switch matrix and automatic probe stations * Consulting on wafer analysis using advanced surface diagnostic techniques (TEM, FIB-SEM, SIMS, TXRF, EDX, XPS, XRD, AES, FTIR, Raman)

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