IC Microanalysis LLC

IC Microanalysis LLC and Chip Patents LLC provide independent and objective expert semiconductor technology consulting services to engineering and intellectual property professionals supporting competitive analysis investigations, licensing, litigation, arbitration, prior art investigations, and patent investment programs. David York, Owner and Consultant at IC Microanalysis LLC and Chip Patents LLC, is a technology professional with over 37 years industry experience, including 23 years providing independent physical and materials analysis of semiconductor products to support competitive, quality, failure and semiconductor patent analysis projects. His expertise includes laboratory and personnel management, hands-on laboratory analysis and equipment operation, process and device structural reverse engineering, competitive product evaluation, physical failure analysis, patent analysis, technology research, prior art investigation, and technical document writing, editing and proofreading. Mr. York has previously held senior level positions at Integrated Circuit Engineering Corporation (ICE) and Chipworks, USA, and has utilized his first-hand experience to provide technical consulting and testimony in support of ICE's public SUB and SCA Product Analysis Reports (commonly used as prior art evidence in patent prosecutions and infringement cases).