IEEE IOLTS - IEEE International Symposium on On-Line Testing and Robust System Design

The IEEE International Symposium on On-Line Testing and Robust System Design explores emerging trends and novel concepts related to all aspects of the robustness of microelectronic circuits and systems. The areas of interest include (but are not limited to) the following topics: - Dependable system design - Dependable Computer Architectures - Design-for-Reliability - Design for Reliability approaches for Low-Power - Cross-layer reliability approaches - Fault-Tolerant and Fail-Safe systems - Functional safety - Self-Test and Self-Repair - Self-Healing design - Self-Regulating design - Self-Adapting design - Reliability issues of Low-Power Design - Robustness evaluation - Quality, yield, reliability, and lifespan issues in nanometer technologies - Variability, Aging, EMI, and Radiation Effects in nanometer technologies - On-line testing techniques for digital, analog, and mixed-signal circuits - Self-checking circuits and coding theory - On-line monitoring of current, temperature, process variations, and aging - Power density and overheating issues in nanometer technologies - Field Diagnosis, Maintainability, and Reconfiguration - Design for Security - Fault-based attacks and countermeasures - Design for Robustness for automotive, railway, avionics, space, large industrial applications, IT infrastructure, cloud computing, and wired, cellular, and satellite communications - CAD for robust circuits design