Laytec

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LayTec is a major provider of integrated optical metrology systems for thin-film processes in the compound semiconductor and photovoltaics industry. LayTec sensors are used in a broad range of thin-film applications such as compound semiconductor epitaxy, photovoltaic, oxide and organic deposition. Advanced use of measurement techniques such as reflectometry, emissivity corrected pyrometry, laser deflectometry, reflectance anisotropy spectroscopy are uniquely combined to create our series of novel products. LayTec’s in-situ metrology provides access to all key thin-film parameters in real-time – either during the deposition process or in-line.

Company Details

Employees
64
Founded
-
Address
Seesener Str. 10-13, Berlin,10709,germany
Phone
493039800800
Email
in****@****ytec.de
Industry
Semiconductor Manufacturing
NAICS
Semiconductor and Other Electronic Component Manufacturing
Website
laytec.de
HQ
Berlin
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News

LayTec launches EpiX modular wafer mapping station for compound semiconductor R&D - Semiconductor Today

LayTec launches EpiX modular wafer mapping station for compound semiconductor R&D Semiconductor Today

LayTec’s EpiCurve TT used in AlInN composition control for III-nitride VCSELs - Semiconductor Today

LayTec’s EpiCurve TT used in AlInN composition control for III-nitride VCSELs Semiconductor Today

FBH uses LayTec's EpiCurve in-situ metrology to eliminate SiC/GaN wafer cracking in ICP etching - Semiconductor Today

FBH uses LayTec's EpiCurve in-situ metrology to eliminate SiC/GaN wafer cracking in ICP etching Semiconductor Today

LayTec extends PearL to t-PearL for time-resolved PL of thin films - Semiconductor Today

LayTec extends PearL to t-PearL for time-resolved PL of thin films Semiconductor Today

LayTec’s EpiTT Band Edge tool used for ZnO substrate temperature and growth rate control in MBE - Semiconductor Today

LayTec’s EpiTT Band Edge tool used for ZnO substrate temperature and growth rate control in MBE Semiconductor Today

LayTec presents in-situ monitoring of 2D materials epitaxy during CVD - Semiconductor Today

LayTec presents in-situ monitoring of 2D materials epitaxy during CVD Semiconductor Today

LayTec details accurate wafer temperature measurement during GaN-on-Si MOCVD for power electronics - Semiconductor Today

LayTec details accurate wafer temperature measurement during GaN-on-Si MOCVD for power electronics Semiconductor Today

LayTec’s SolR monitors 50 nm thin layers - Semiconductor Today

LayTec’s SolR monitors 50 nm thin layers Semiconductor Today

LayTec adds nanoscale SPC for quaternary films to EpiNet 2016 analysis software - Semiconductor Today

LayTec adds nanoscale SPC for quaternary films to EpiNet 2016 analysis software Semiconductor Today

LayTec’s EpiCurve TT used for strain engineering of GaAs-based laser structures - Semiconductor Today

LayTec’s EpiCurve TT used for strain engineering of GaAs-based laser structures Semiconductor Today

Semiconductor Today - Semiconductor Today

Semiconductor Today Semiconductor Today

LayTec metrology speeds up process development on 100mm semi-polar (11-22) GaN on r-plane PSS - Semiconductor Today

LayTec metrology speeds up process development on 100mm semi-polar (11-22) GaN on r-plane PSS Semiconductor Today

LayTec's EpiNet 2017 software enables in-situ wafer bow measurement in multi-pocket satellite configuration - Semiconductor Today

LayTec's EpiNet 2017 software enables in-situ wafer bow measurement in multi-pocket satellite configuration Semiconductor Today

LayTec’s EpiCurveTriple TT used for 200mm GaN-on-Si at Singapore’s IMRE - Semiconductor Today

LayTec’s EpiCurveTriple TT used for 200mm GaN-on-Si at Singapore’s IMRE Semiconductor Today

LayTec EpiTT used to optimize MBE growth of InP-based quantum cascade lasers - Semiconductor Today

LayTec EpiTT used to optimize MBE growth of InP-based quantum cascade lasers Semiconductor Today

Semiconductor Today - Semiconductor Today

Semiconductor Today Semiconductor Today

LayTec’s EpiCurve TT improves HVPE GaN growth at Ulm university - Semiconductor Today

LayTec’s EpiCurve TT improves HVPE GaN growth at Ulm university Semiconductor Today

LayTec ships new EpiTT Band Edge tool for MBE of VCSELs - Semiconductor Today

LayTec ships new EpiTT Band Edge tool for MBE of VCSELs Semiconductor Today

FBH uses LayTec’s EpiTT Gen3 metrology tool for high-temperature MOCVD growth of AlN/sapphire templates for UV LEDs - Semiconductor Today

FBH uses LayTec’s EpiTT Gen3 metrology tool for high-temperature MOCVD growth of AlN/sapphire templates for UV LEDs Semiconductor Today

LayTec receives first order for EpiTT/VCSEL - Semiconductor Today

LayTec receives first order for EpiTT/VCSEL Semiconductor Today

NTT uses LayTec’s EpiCurve TT to optimize InGaAs metamorphic buffer for laser diodes - Semiconductor Today

NTT uses LayTec’s EpiCurve TT to optimize InGaAs metamorphic buffer for laser diodes Semiconductor Today

First in-situ PL of growing InGaN/GaN MQW LED structure during MOCVD - Semiconductor Today

First in-situ PL of growing InGaN/GaN MQW LED structure during MOCVD Semiconductor Today

Semiconductor Today - Semiconductor Today

Semiconductor Today Semiconductor Today

Accuracy of LayTec EpiTT Gen3's XRD-referenced nk database improved for InP-based materials - Semiconductor Today

Accuracy of LayTec EpiTT Gen3's XRD-referenced nk database improved for InP-based materials Semiconductor Today

Semiconductor Today - Semiconductor Today

Semiconductor Today Semiconductor Today

Semiconductor Today - Semiconductor Today

Semiconductor Today Semiconductor Today

Semiconductor Today - Semiconductor Today

Semiconductor Today Semiconductor Today

Cariflex Opens World's Largest Polyisoprene Latex Plant in Singapore, Following Over US$350 Million Investment - PR Newswire

Cariflex Opens World's Largest Polyisoprene Latex Plant in Singapore, Following Over US$350 Million Investment PR Newswire

PHOTOS. La robe en latex rose ultra-moulante de Katy Perry pour son anniversaire - Closer

PHOTOS. La robe en latex rose ultra-moulante de Katy Perry pour son anniversaire Closer

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