LUME

The LUME covers the main techniques of electron microscopy, from scanning electron microscopy (SEM) to scanning transmission electron microscopy (STEM), for the characterization of the morphology and atomic structure of materials. In addition, it has equipment for sample preparation for analysis. * Topological study of samples by SEM * Particle size measurements * Determination of crystalline phases * Determination of chemical composition by energy dispersive spectroscopy (EDS) * Determination of crystallographic texture by backscattered electron diffraction (EBSD) * Structural study at the atomic level of materials and nanomaterials by TEM/STEM * Diffraction Imaging * Images of structural defects * Atomic resolution imaging in high-angle annular dark-field (HAADF) and bright-field (BF) modes * Selected Area Electron Diffraction * Nano-area electron diffraction and nano-diffraction * Preparation of samples for electron microscopy