MEO Engineering Company, Inc.

Ion and electron beam technology solutions and instrumentation, design, construction and service of ion and electron beam systems, third-party accessories, consumables, parts, service, and support for Focused Ion Beam (FIB), Scanning Electron Microscope (SEM), dual-beam FIB/SEM equipment from various manufacturers. Third-party service, upgrades, spare parts, consumables, and process development support for broad range of particle beam instrumentation, including Focused Ion Beam (FIB) systems manufactured by former Micrion Company, FIB and FIB/SEM equipment manufactured by FEI Company, and Scanning Electron Microscopy (SEM) tools from various SEM manufacturers including Zeiss, Leo, Hitachi, and industrial CD-SEM and DR-SEM tools manufactured by Opal and Applied Materials.