During my previous work I participated in development of different technologies, including optical nanoscale inspection, mobile blood pressure measurements, multipath NIR spectrometry, indirect ToF camera performance improvement. My main responsibilities were electromagnetic simulation and algorithm development. I also participated in experimental setup alignment (optics), spectroscopic measurements and prototyping.I supervised the development of optic technology for sub 10 nm defect inspection for semiconductor industry. I was responsible for electromagnetic simulations, reporting, maintaining interaction between different research groups (South Korea, Russia). The project resulted in the world’s first demonstration of technique for detection of sub-10 nm defects on silicon.The results are described in the publications below.My research experience is the following:Electromagnetic simulation (optics). Simulation of optical properties of different nanostructures (homogeneous and multilayer metal-organic particles (characteristic dimensions ~ 10-200 nm) of different shape and geometrical parameters). Nonlinear optical properties simulation. Quantum optics simulations. Acoustcic simulation. Computational microscopy algorithms development. Optical experimental setup alignment. Spectroscopy measurements. Experimental data analysis. Silicon photonics design.