•Operate, maintain, and calibrate focused ion beam (FIB) systems for various applications in research and manufacturing.• Utilize FIB systems for sample preparation, high-resolution imaging and analysis of materials, including scanning electron microscopy (SEM), scanning transmission electron microscopy (STEM), and energy-dispersive X-ray spectroscopy (EDS).• Ph.D. (specialization in microelectronics): Involves synthesis of electrode materials, device fabrication, thermal evaporation, sputtering technique, thin film deposition•Hands on experience in characterization of electrode material using SEM, XRD, EDX, electrochemical measurements such as Cyclic Voltammetry, Galvanostatic charge discharge measurements, EIS measurements, Keithley 4200 SCS for resistance measurements.•Qualified GATE in 2017•Qualified UGC NET+ JRF in 2017.•4 years of teaching experience in the Electronics and Communication Department at Thapar Institute of Engineering and Technology, Patiala. •Worked as an assistant professor at Chandigarh University, India. •4 SCI publications.•1 SCOPUS indexed Conference held at IIT-Jodhpur.•Awarded with “India Top Cited Paper Award 2022” by IOP publishing.•Awarded Senior Research and Junior Research Fellowship from University Grants Commission India.