More than 18 Years of Experience in Test Program Development Using Automated Test Equipment (ATE) [X-series, Diamond, Falcon and Piranha].As an IC final and wafer test program developer, I have done all the phases of test development from hardware load board design, software test program coding, test debugging, test qualification, throughput optimisation ... to yield improvement and cost saving (e.g. test time reduction) in the production. I had developed test programs for mix signal automotive devices, microcontroller and some experience in RF testing for simple RF switches and LNA devices.I worked with minimal supervision at customer sites but delivered great results to customers in Germany, Japan, Singapore, Taiwan and Malaysia. I had conducted semiconductor ATE training classes in Taiwan, Japan, Germany, Singapore and Malaysia.I always put my utmost effort and responsibility to tasks given.