Dr. Jagdish C S Email & Phone Number

Wilmington, MA, US

Chelmsford, MA, US

· Initiated CCG product management, strategy & development of the contamination control business on the wafer FOUPS and reticle stockers side.· Led efforts to develop an IP strategy for the CCG business units and product lines.· Proposed new product lines by engaging with upcoming fabs to understand their contamination control requirements in the domain of.

Oberkochen, DE

• Corporate Research & Technology (Innovation Management)- Zeiss
• Explored key technologies for advancement of semiconductor roadmap. Specifically focussing on EUV optics combined inspection and metrology and proposed ideas that got adopted into two products resulting in 2 patents.
• Proposed, evaluated projects new business opportunities and startup ecosystems in semiconductor domain that are being actively tracked.
• Explored upcoming lithography technologies for for advancing semiconductor manufacturing to 2nm node and beyond.
• Led and conceptualised projects focused on metrology, failure analysis and automation that were adopted for EUV projects for actinic inspection.

Oberkochen, DE

• Led collaborative efforts with premiere research institutions like ASTAR, IME and I2R to develop solutions in the space of semiconductor packaging, wafer inspection and metrology.
• Invented and patented 5 workflows for defect imaging, process window analysis using Zeiss Multisem.
• Designed novel defect inspection algorithms based on die to database method that was patented.
• Proposed novel methods with Zeiss X-ray microscope for investigation of packaging defects using X-ray inspection technique.
• Created a semiconductor ecosystem within the group as a subject matter expert by conducting workshops on semiconductor manufacturing, process optimisation and defect inspection ecosystem. Training teams on various.

Milpitas, California, US

Led critical dimension uniformity (CDU) project for eBeam division. Designed, developed and patented ideas for defining critical patterns for CDU measurement.

Milpitas, California, US

• Technical consultant and Product owner for UX/UI design of the software product that involved co-creation of a 'new language' to describe semiconductor defects in terms of polygon features and helped deploy the.
• Created predictive analytics based strategies for detecting defects on semiconductor wafers.
• Created a design team by training global & division application engineers and product engineering teams by creating training material and conducting multiple workshops.

Armonk, New York, NY, US

• Developed Optical Proximity Correction (OPC) and Optical Rule Check (ORC) recipes for semiconductor mask fabrication and correction of on-wafer patterns for the 32 nm and 22 nm technologies solving key yield issues at.
• Developed customized OPC rules for R&D of silicon photonic structures by providing solutions for curved waveguide structures in association with IBM Watson - Yorktown

Puttaparthi, Andhra Pradesh, IN

Pg Diploma, Strategy And Innovation

Doctor Of Philosophy (Phd), Nonlinear Optics - Optical Imaging For Medical Diagnostics