Mohammed W Rony, Ph.D.
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Mohammed W Rony, Ph.D. Email & Phone Number

Quality And Reliability Engineer @ Intel Corporation | Device Physics | Radiation Effects | Testing and Modeling at Intel Corporation
Location: Hillsboro, Oregon, United States 8 work roles 3 schools
1 work email found @vanderbilt.edu LinkedIn matched
✓ Verified Jul 2026 4 data sources Profile completeness 100%

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Role
Quality And Reliability Engineer @ Intel Corporation | Device Physics | Radiation Effects | Testing and Modeling
Location
Hillsboro, Oregon, United States
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Mohammed W Rony, Ph.D. is listed as Quality And Reliability Engineer @ Intel Corporation | Device Physics | Radiation Effects | Testing and Modeling at Intel Corporation, a with 10 employees, based in Hillsboro, Oregon, United States. AeroLeads shows a work email signal at vanderbilt.edu and a matched LinkedIn profile for Mohammed W Rony, Ph.D..

Mohammed W Rony, Ph.D. previously worked as Quality And Reliability Engineer at Intel Corporation and Phd Research Assistant at Vanderbilt University. Mohammed W Rony, Ph.D. holds Doctor Of Philosophy - Phd, Electrical Engineering from Vanderbilt University.

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About Mohammed W Rony, Ph.D.

CMOS Characterization | Failure analysis | Lab Tests | TCAD modeling | Radiation effects | SPICE ................................. Summary - Extensively worked with JPL, DTRA, US Air Force on various projects- 6 years of experience in designing & executing lab experiments for CMOS device characterization and failure analysis- Extensively simulated & characterized Si/Ge/InGaAs/GaN based FinFET/SOI/Nanowire/NAND cells using TCAD- Expert in testing and modeling radiation effects in devices/circuits/ICs: TID, SEE, SEU, SEFI, SEL- Proficient in statistical data analysis using Python, MATLAB, and scripting languages (Tcl/Perl, shell)................................. Device characterization tools HP4156A/B, Keithley 4200A used to investigate current-voltage (I-V), capacitance-voltage (C-V), Negative Bias Temperature Instability (NBTI), Hot Carrier Effects (HCE) stress test, Low frequency Noise (1/f noise)................................. Lab test equipments Logic analyzer/oscilloscopes, function generators, semiconductor parametric analyzer (SPA), electrical probing stations, device packaging and bonding on high speed packages................................. Device modeling tools - 2D and 3D CMOS device simulation in Sentaurus Process/Structure Editor/Device/Visualization- Drift-diffusion, hydrodynamic, thermodynamic, and quantum transport modeling- Quasi-stationary/transient/Monte-Carlo device simulation in standalone/mixed-mode- Modeling memory devices: carrier tunneling, trapping, de-trapping, floating gates- Modeling radiation effects: single event transient (SET), total ionization dose (TID)- Electrical & thermal effects in power devices (SiC, GaN), optoelectronic characteristics modeling of CMOS................................. SPICE modeling tools Device & circuit modeling, Monte-Carlo simulation in Mentor-graphics Eldo, Questa-ADMS, & HSPice................................. Radiation effects characterization tools ARACOR X-ray source, Pulsed Laser & Heavy Ion source, Proton beams, CRÈME96 to investigateSingle Event Effects (SEE), Single Event Upsets (SEU), Single Event Transients (SET), Single Event Latch-up (SEL), Single Event Functional Interrupt (SEFI), Soft errors, Prompt dose, Total Ionizing Dose (TID), SET Cross-section................................. Programming Languages Python, Tcl/Perl, Shell scripting, MATLAB, Verilog, Verilog-A/MS, C/C++

Listed skills include Application Specific Integrated Circuits, C, Verilog, Cgi/Perl, and 48 others.

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Intel Corporation
Intel Corporation
Quality And Reliability Engineer @ Intel Corporation | Device Physics | Radiation Effects | Testing and Modeling
(408) 765-8080
Website
Employees
10
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8 roles

Mohammed W Rony, Ph.D. work experience

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Quality And Reliability Engineer

Current

Santa Clara, California, Us

Jan 2022 - Present

Phd Research Assistant

Nashville, Tennessee, Us

NBTI & Total Ionizing Dose (TID) effects in deeply scaled HfO2/SiO2/Si gate stack Ge nanowire devices+Tested NBTI/TID behavior to characterize Ge nanowire devices, used charge separation method to estimate oxide/interface traps, reliability & lifetime. Built radiation & two stage NBTI TCAD models to explain the mechanismSingle-event-induced charge collection in Ge-channel pFinFET and GAA devices+Performed heavy ion and pulsed laser tests to characterize bias dependency of Single-Events-Effects (SEE), developed heavy ion model using Sentaurus Process & device, and calibrated to explain the physics behind charge collectionIonizing-Dose-Aware Behavioral Model of A/D Converters for Sphinx C&DH board used in CubeSats+Designed architectural models of Flash, SAR, Pipeline ADCs, performed TID tests to evaluate the parametric radiation sensitivity of commercial ADC Comparison of Total-Ionizing-Dose Effects in Bulk and SOI FinFETs at 90K and 295K+Solved significant challenges associated with TCAD device simulation at cryogenic temperature, performed proton test to characterize device architecture & temperature dependence of radiation-induced trapped-charges3D Full-Band Monte-Carlo Simulation of Hot-Electron Energy Distributions in Gate-All-Around Si Nanowire+Built 3D Monte-Carlo TCAD model and used Subband-BTE solver to characterize Hot-Electron energy distributionsHigh-field stress induced defects characterization in AlGaN/GaN HEMTs+3D TCAD model is developed considering piezoelectric polarization and donor traps at the interface to characterize stress induced defects

Aug 2017 - Dec 2021

Ltd Quality & Reliability Intern

Santa Clara, California, Us

May 2021 - Nov 2021

Graduate Research Intern

Institute For Space And Defense Electronics (Isde)

Ionizing-Dose-Aware Behavioral Model of A/D Converters for Sphinx C&DH board used in CubeSats+ Ionizing dose aware architectural models of Flash, SAR, Pipeline ADCs are designed for system (board) level simulation+ Planned and executed TID tests to evaluate the parametric radiation sensitivity of A/D converters used in spaceships+ Models are validated using test results both in standalone mood and temperature control loop system of spacecraft+ Millions of sampled data from Monte Carlo runs are pre-processed, analyzed, and plotted using python and MATLAB

May 2019 - Aug 2019

Graduate Soc Design Intern

Santa Clara, California, Us

+ Built and ran STA model to check non-unate paths in clock network, unconstrained end points, un-clocked sequential nodes, unconnected power pins, un-annotated nets and dirty pins+ Extracted parasitic and ran STA to check setup, hold, transition violations for reg-to-reg timing analysis & optimization+ Manually fixed violations for timing closure, finally checked DRC and LVS of the design and fixed the DRC violations+ Evaluated PV quality to analyze inter-partition violations, provided timing feedback, and refined partition IO constraints+ Generated clock definition & collateral for Syn/APR (1GHz/2GHz) using Tcl/shell scripting & traced missing definition+ Implemented global clock tree and delivered partition floorplan collateral with global clock tree push-down to enablebetter quality CTS runs+ Built full-chip caliber (DRC) model with partitions waivers, synced up with fron-end to validate UW, GW configurations,debugged and generated missing timing reports before running DRC, debugged and cleaned run time errors,+ Ran several iterations of block level PnR to optimize timing, written scripts to check RTL quality and flop stats toprovide RTL feedback and validate RTL fixes, provided scan-inserted net list to ATPG team+ Explored hierarchical design flow by optimizing at synthesis stage, created floorplan boundaries, define timingconstraints, ran APR, troubleshot on the fly, set/unset required G_variables+ Written shell/Tcl scripts to automate Syn/Place/Route/post-CTS layout QoR analysis in a graphical environment

Aug 2018 - Dec 2018

Graduate Research Student

Beaumont, Tx, Us

• PVT modeling of CMOS to reduce short channel effects (SSLOPE=~68mV/dec, DIBL=8mV/V).• Cell delay optimized with low Subthreshold slope.• Low power ASIC implementation with low leakage cell, MTCMOS, DTCMOS, multi-domain VDD• Dual-gate gate-all-around (GAA) Junctionless Nanowire Transistor (JNT) modeling.• Short Channel Effects (SCE) suppression by novel device architecture.• Mobility degradation analysis due to phonon scattering and surface roughness scattering. • Self-heating and effects of quantum confinement on this nano scale device. • Observing classical and quantum behavior for various boundary conditions.• Process variability analysis using Non-Equilibrium Green's Function (NEGF).• Radiation impact and cross-talk noise reduction by designing dual-channel concept.

Aug 2014 - Jul 2016

System Engineer

Dhaka, Bd

Integration and configuration of transmission,core and radio network.• Excellent client communication skills in terms of both business and technical commutations.• Technical analysis, fault handling and enhancement of voice, data and value added services provided by different vendors.• Solid technical skill & troubleshooting experience in the largest DWDM and SDH Optical Network of Bangladesh (700+ SDH & DWDM mux), SDH/PDH/Hybrid Microwave & IP Networking• Allocate and optimize necessary end-to-end capacity for all types of Trunk E1,SS7, SIGTRAN signaling and BTS as per business forecast.• Soft Rerouting (planning, execution) of traffic on emergency and remote support to network engineers for physical fault handling.• Review RF parameters of cell sites and drive test log analysis• Terminal base fault handling regarding RBS and Radio performance related fault.

Jan 2011 - Aug 2013

Lecturer, Department Of Elctrical & Elctronic Engineering

Prime University

My responsibility included teaching, preparing question papers, taking exams and other official duties. Learnt to lead and guide a group of people, delivering thoughts and presentations to audiences

Jun 2010 - Dec 2010
Team & coworkers

Colleagues at Intel Corporation

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3 education records

Mohammed W Rony, Ph.D. education

Doctor Of Philosophy - Phd, Electrical Engineering

Vanderbilt University

Master’S Degree, Electrical Engineering

Lamar University

Bachelor’S Degree, Electrical And Electronics Engineering

Khulna University Of Engineering And Technology
FAQ

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Quick answers generated from the profile data available on this page.

What company does Mohammed W Rony, Ph.D. work for?

Mohammed W Rony, Ph.D. works for Intel Corporation.

What is Mohammed W Rony, Ph.D.'s role at Intel Corporation?

Mohammed W Rony, Ph.D. is listed as Quality And Reliability Engineer @ Intel Corporation | Device Physics | Radiation Effects | Testing and Modeling at Intel Corporation.

What is Mohammed W Rony, Ph.D.'s email address?

AeroLeads has found 1 work email signal at @vanderbilt.edu for Mohammed W Rony, Ph.D. at Intel Corporation.

Where is Mohammed W Rony, Ph.D. based?

Mohammed W Rony, Ph.D. is based in Hillsboro, Oregon, United States while working with Intel Corporation.

What companies has Mohammed W Rony, Ph.D. worked for?

Mohammed W Rony, Ph.D. has worked for Intel Corporation, Vanderbilt University, Institute For Space And Defense Electronics (Isde), Vlsi Cad & Signal Integrity Lab, Lamar University, and Grameenphone Ltd.

Who are Mohammed W Rony, Ph.D.'s colleagues at Intel Corporation?

Mohammed W Rony, Ph.D.'s colleagues at Intel Corporation include Hector Tolentino, Kaiann Fu, Pavan Kumar H G, Alma Patricia Perez, and George Mattson.

How can I contact Mohammed W Rony, Ph.D.?

You can use AeroLeads to view verified contact signals for Mohammed W Rony, Ph.D. at Intel Corporation, including work email, phone, and LinkedIn data when available.

What schools did Mohammed W Rony, Ph.D. attend?

Mohammed W Rony, Ph.D. holds Doctor Of Philosophy - Phd, Electrical Engineering from Vanderbilt University.

What skills is Mohammed W Rony, Ph.D. known for?

Mohammed W Rony, Ph.D. is listed with skills including Application Specific Integrated Circuits, C, Verilog, Cgi/Perl, Perl Automation, Perl, Static Timing Analysis, and Design Compiler.

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