Instrumentation professional with over 30 years experience in xray microanalysis, bulk xray analysis, electron microscopy, raman spectroscopy, NIR and FTIR spectroscopy, semiconductor FAB instrumentation and atom probe tomography.Extensive travel installing instruments, training engineers, end-users and agents, performing onsite troubleshooting and repair of complex analytical instrumentation.Extensive experience interfacing with third party manufacturers of electron microscopes in marketing, sales and engineering capacities.Self starter and very experienced working in field situations. Resided in Japan for 5 years during start up of a wholly owned subsidiary for Oxford Instruments.Successfully trained and mentored Field Service Engineers from all over the world with varying backgrounds and capabilities including in-house training classes, e-learning, web based real-time learning sessions and regional training classes.Specialties: Training of Field Service Engineers and customers.Installing and providing support of hardware and software of complex microscopy systems and analytical instruments, making sure the result is a very happy customer which results in a very profitable company.