Cameca

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CAMECA is a world-leading supplier of high-performance analytical instrumentation and metrology solutions for development, production support, and basic materials research. Our instruments equip prestigious government and university labs as well as leading high-tech industrial companies around the world. Founded in 1929, CAMECA rapidly established its name by pioneering, first Electron Probe Micro-Analysis (EPMA), followed by Secondary Ion Mass Spectrometry (SIMS), and more recently Atom Probe Tomography (APT). Our state-of-the-art production facilities in France and the US allow our experts to develop the most sophisticated micro-analytical tools addressing all kinds of issues from the protection of the environment to intracellular drug localization or the development of advanced semiconductor devices.

Company Details

Employees
316
Founded
-
Address
29 Quai Des Grésillons, Gennevilliers Cedex,fr 92622,france
Phone
33 1 43 34 62 00
Email
ca****@****.com.br
Industry
Nanotechnology Research
NAICS
Research and Development in Nanotechnology
Website
cameca.com
HQ
Gennevilliers Cedex, FR
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News

EX-300 Shallow Probe Semiconductor Metrology Tool from CAMECA : Quote, RFQ, Price and Buy - AZoM

EX-300 Shallow Probe Semiconductor Metrology Tool from CAMECA : Quote, RFQ, Price and Buy AZoM

Introducing field evaporation energy loss spectroscopy - Communications Physics - Nature

Introducing field evaporation energy loss spectroscopy - Communications Physics Nature

CAMECA Launches Two New Ultra High Sensitivity SIMS Instruments Dedicated to Geo and Environmental Sciences - Cision News

CAMECA Launches Two New Ultra High Sensitivity SIMS Instruments Dedicated to Geo and Environmental Sciences Cision News

Grain boundary oxidation of proton-irradiated nuclear grade stainless steel in simulated primary water of pressurized water reactor - Nature

Grain boundary oxidation of proton-irradiated nuclear grade stainless steel in simulated primary water of pressurized water reactor Nature

Correlative atom probe tomography and scanning transmission electron microscopy reveal growth sequence of LPSO phase in Mg alloy containing Al and Gd - Nature

Correlative atom probe tomography and scanning transmission electron microscopy reveal growth sequence of LPSO phase in Mg alloy containing Al and Gd Nature

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