• Electrical measurements of silicon wafers in the FEOL level,• Long-term device reliability check at wafer level

Thesis Title: Analysis of stress distribution and fracture toughness related to process defects on silicon wafers.Objectives:• Fracture toughness analysis of silicon (Si) w/ and w/o defects. • Analysis of bending properties of the Si wafers.• Stress analysis at/around defects on Si.• Correlation between defect strength and Silicon strength.• Investigations on wafers with process-related defects. • Classification of process related defects.• FEM model to validate the experimental results.• Statistical model for defect density estimation over 300-mm complete wafers

• Systematic investigation of defects control of production wafers. • Defect analysis by Raman spectroscopy & different microscopy. • Performing regular job requests related to:– mechanical analysis of production wafers by Ball-on-Ring tester. – electrical analysis of production wafers by AFM, SEM.• Improvement of biaxial fracture toughness measurement setup.• Introduction of artificial defects (using laser/micro-indenter) to correlate the defectivity in production wafers

• KPI tracking, Data mining• Manufacturing data automation (Power BI/QlikView/DCube).• Defect Reviews for wafer quality control.

Project Title: Design of a Low Noise Amplifier(LNA) in 22nm-FDX technology for 60GHz receiver.Objectives:• Device characterization of 22FDX CMOS in Cadence.• Investigation of FEOL and BEOL parasitics on Design.• LNA Design for high frequency application.• Accomplished design features: Band-pass filter effect, Gain boosting technique, BW tuning

• Performing regular job requests related to electrical characterizations of production wafers using AFM/SSRM.• Research on improving SSRM measurement of SiC samples.• Optical inspection of production wafers in various microscopy (e.g Photo-emission/LASER/Dual-beam).• Data mining and automation (Excel VBA) for quick reporting

• Statistical large data set analysis.• Data automation (Excel VBA) for quick decision-making

• High voltage Data check.• Substation Design checking in AutoCad.• Monitoring, Improving the high voltage Site

Thesis Title: Simulation and Analysis of Graphene as Top Trans- parent Conductive Layer in Thin Film Solar Cell.Objectives:• Literature Review of Amorphous & Provskite solar cells.• FEM-Model of solar cell with different transparent layers. • Analysis of optical and electrical properties