 Implement characterization test onopen/short, logic/functional, ICC, performance, Data Latches/SA, AC timing (Legacy and DDR mode), RomFuse parameter trimming (timing & voltage)for Nand Flash memory, across process, operating voltage and temperature Lead team to integrate test programs for different test items to one final program, and ensure the program correct and reliable with less test time  ATE and handler configuration for automatic volume parallel testing Execute the low yield, and failure analysis on issues pertaining to design marginality Visual Basic development for data analysis and report generation  Deliver test report on time and follow up the remaining issues  Integrate digital oscilloscope, logic analyzer and testers to analyze Nand Flash operation for silicon debug Prepare detailed documents and train new college graduates the test program, test pattern, and test methodology Collaborate with designer, product engineer, failure analysis engineer and package engineer, to analyze the low yield and failure issue for OEM customer