Senior Algorithm Engineer
Current- POR multi-die statistical defect detection algo- POR algo infrastructure major improvement to support multi-dies- Statistical patterned wafer defect detection algorithm on laser scanning system- Algo infrastructure feature developing and maintenance- Owner of overlay measuring algorithms for uLED mass transfer process- Owner of 3D metrology algorithms for thin-film flexible OLED and uOLED products- Major developer of two metrology modules on AOI machines