I have over 30 years experience in the semiconductor industry, mostly in semiconductor test engineering and also in semiconductor failure analysis. I've worked in all aspects of test engineering from system design, test interface design and engineering, probe cards, test program development, data handling and movement, tool engineering and characterization. I have a deep and broad working knowledge of the Keysight 4070/4080 Parametric Test System, the Advantest 93000 platform and TEL P-12/Precio/PrecioXL probers. Most of my functional test experience has been in the area of novel non-volatile memory technologies and AI.