The Scanning Thermal Microscope is the essential equipment to study the thermal behavior of the nanowire and the transmitter in nanoscale. The precise control of the tip-sample contact is crucial. Unfortunately, the probe surfers from the unexpected thermal deformation due to the bimetallic effect, and this makes the function fail. The combination of the numerical simulation and the multi-objective optimization is the most promising solution for optimization of the probe design, however, a few hours single round simulation time makes the optimization unaffordable. In this specific case, the two-scale model deduce the 3-Dimensional equation into a 2-Dimensional equation, and its computation cost is only 1% of the direct simulation. The two-scale model based optimization makes the following performance improvement:1. Thermal Deformation was reduced by 96%2. Temperature sensitivity was increased by 400%