Asian Test Symposium (ATS) 2024

The Asian Test Symposium (ATS) is the premier conference being organized annually across pan-Asian countries by IEEE Computer Society and IEEE Council of Electronic Design Automation CEDA. ATS provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board and system testing with design, manufacturing and field considerations in mind. Major topics include, but are not limited to: • Automatic Test Pattern Generation (ATPG) • Analog Test / Mixed-Signal Test • Boundary Scan Test • Board and System Test • Built-In Self-Test • Design for Testability (DFT) • Design Verification and Validation • Defect-Based Testing • Delay and Performance Test • Diagnosis and Debug • Dependable System • Economics of Test • Fault Modeling and Simulation • Fault Tolerance • High-Speed I/O Test / RF Testing • Memory Test / FPGA Test • On-Line Test • System-on-a-Chip Test • System-in-package (SiP) / 3D Test • Software Testing / Software Design for Testing • Test Compression • Temperature / Power-aware Test • Test Quality • Yield Analysis and Enhancement About ATS 2024 ATS 2024, the 33rd edition of the Asian Test Conference is coming to India, and is happening in Ahmedabad, Gujarat, The organizing committee of ATS 2024 invites you and your colleagues to submit papers, research articles and attend this prestigious Symposium.