Eric Davis Email & Phone Number

Santa Barbara, Ca, Us

Goleta, California

- Developed test-automation GUIs using LabView, Keysight E5071C VNA, and Prologix GPIB-USB Controller to reduce man-hours and errors when performing Small-Signal RF measurements.- Developed multi-functional small-single test setup using a LabView, Mini-circuits Switch-box, Keysight E5017C VNA, and a Prologix GPIB-USB to increase the throughput of tested samples by up to 3x per VNA. The program handles all measurement "requests" using unique states per switch configuration to ensure accuracy of the measurements.- Developed wafer prober automation using a LabView, Keysight E5071C VNA, Electroglas 2001X, and Prologix GPIB-USB Controller. This program cuts down MINIMUM 1.5 man hours per wafer.- Developed a bar-code reader and database to track DUT information on a per-sample basis.- Performed HTOL characterization, test-set up, and failure analysis.- Performed testing and analysis of small single measurements for filters, duplexers, and quadplexers.- Closely worked alongside RF Designers to ensure accuracy of tested samples.- Manually calibrated and probed phone boards, wafers, and single dies. Smallest scale was about 250 microns.- Occasionally assembled DUTs, test samples, and soldered hardware matching components.- Documented test-set ups and code for automation.

Goleta, California

- Wrote MatLab scripts to interpolate and average conductivity measurements from raw single port s-parameters, calculated statistics on lab test performance using MatLab scripts, and measured RF bandpass filters, single resonators, and metal contact responses. - Utilized wafer probe system to test resonators and metal contact pads, measured frequency shifts in bandpass filters, and generated a tracking system for product components and test equipment.

- Processed LED (GaN and GaAs) and CMOS based production semiconductor wafers in a class 100/1000 clean-room using various FAB tools and processes including PECVD oxide deposition, e-beam metal deposition, photo-lithography, etching and liftoff.- Collected and analyzed PECVD temperature differential data and wrote a report on the impact of PECVD oxide deposition rates based on the internal tool and wafer temperature. Most notably, I assisted a Senior process engineer in the development of a TEOS oxide deposition recipe.

- Developed a LabView program utilizing a Watlow PID controller to automate oven operations. The program simultaneously ran recipes and continually logged data for up to five ovens.