Failure Analysis Engineer - Advanced Technology Development - Globalfoundries / IBM Microelectronics► Guided, directed, and instructed fellow engineers and technicians on instrument use, localization strategies, and results interpretation.► Provided concise reporting and rapid feedback to the appropriate engineering and development communities.► Experience with Optical Microscopy, Electron Microscopy, Focus Ion Beam (single and dual beam), sample preparation, sample decoration, and inverted TEM lamella creation.► Hands-on isolation of defects using electrical, physical, and optical isolation techniques including bench testing, OBIRCh, and in-situ SEM probe systems.Email: lloyd.smith.1119@gmail.com
Listed skills include Failure Analysis, Semiconductor Failure Analysis, Scanning Electron Microscopy, Semiconductors, and 8 others.