• Ph.D. physical/analytical chemist with diverse research and development experience• Method development in separations using gas and liquid chromatography• Surface science and compositional analysis of polymers and catalysts using XPS, pyrolysis GC-MS, and TOF-SIMS.• Surface analysis of semiconductor materials and devices using scanning probe microscopy, optical profilometry, Auger electron spectroscopy, XPS, and TOF-SIMS.• Radiation chemistry, photo-chemistry, and kineticsSpecialties: * Physical and electrical characterization of semiconductor materials * Scanning probe microscopy: AFM, SCM, SSRM, TUNA, SSPM, STM* Optical profilometry/scanning white light interferometry* NMR spectroscopy of polymers and catalysts*Gas chromatography method development.
Listed skills include Microsoft Technologies, Data Center, Windows Server, Virtualization, and 28 others.