David Seiler Email & Phone Number

David Seiler is a Microelectronics Senior Advisor at National Institute of Standards and Technology (NIST) at National Institute of Standards and Technology (NIST).

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  Microelectronics Senior Advisor

  National Institute Of Standards And Technology (Nist)

  Oct 2021 - Present - Gaithersburg, Maryland, United States

  Prior to joining OAM, David had over 20 years of experience as Chief of the Semiconductor Electronics and Engineering Physics Divisions at NIST, working with industry to provide innovative measurement science research and standards for dimensional, nanometer-scale, surface, and acoustic pressure measurements; semiconductors; microelectromechanical systems (MEMS); power electronics; nanoelectronics; smart grid; and flexible and printed electronics. He is a Fellow of the American Physical Society and the Institute of Electrical and Electronic Engineers (IEEE).David contributed to the NTRS Roadmaps in 1991, 1994, and 1997, as well as the ITRS Roadmaps in 1999 and subsequent years. He was a member of International SEMATECH's Analytical Lab Managers Working Group. At NIST, he led two industrial surveys on characterization measurements for HgCdTe and optical characterization methods for the semiconductor industry. He has also served on the IEEE Electron Device Society's Semiconductor Manufacturing Committee, the IEEE's Corporate Innovation Award Committee, and the Governing Council of the Nanoelectronics Research Initiative (NRI) (a model for industry-driven consortia seeking a new paradigm beyond CMOS devices).Dave has authored more than 160 invited and contributed papers and given over 200 talks at national and international meetings. In addition, he has been Chairperson and Proceedings Editor of numerous Conferences or Workshops including the International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, a series he initiated to address the measurement needs of the semiconductor industry. More recently (2017), he co-edited a comprehensive book titled Metrology and Diagnostics Techniques for Nanoelectronics with Intel VP Zhiyong Ma.As Senior Advisor for Microelectronics, Dave provides technical guidance on the formation of extramural research and development programs to support U.S. semiconductor manufacturing.